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Results: 1-4 |
Results: 4
DEGRADATION AND BREAKDOWN OF THIN SILICON DIOXIDE FILMS UNDER DYNAMICELECTRICAL STRESS
Authors: NAFRIA M SUNE J YELAMOS D AYMERICH X
Citation: M. Nafria et al., DEGRADATION AND BREAKDOWN OF THIN SILICON DIOXIDE FILMS UNDER DYNAMICELECTRICAL STRESS, I.E.E.E. transactions on electron devices, 43(12), 1996, pp. 2215-2226
FREQUENCY-DEPENDENCE OF DEGRADATION AND BREAKDOWN OF THIN SIO2-FILMS
Authors: NAFRIA M YELAMOS D SUNE J AYMERICH X
Citation: M. Nafria et al., FREQUENCY-DEPENDENCE OF DEGRADATION AND BREAKDOWN OF THIN SIO2-FILMS, Quality and reliability engineering international, 11(4), 1995, pp. 257-261
RELATION BETWEEN DEGRADATION AND BREAKDOWN OF THIN SIO2-FILMS UNDER AC STRESS CONDITIONS
Authors: NAFRIA M YELAMOS D SUNE J AYMERICH X
Citation: M. Nafria et al., RELATION BETWEEN DEGRADATION AND BREAKDOWN OF THIN SIO2-FILMS UNDER AC STRESS CONDITIONS, Microelectronic engineering, 28(1-4), 1995, pp. 321-324
HIGH-FIELD DYNAMIC STRESS OF THIN SIO2-FILMS
Authors: NAFRIA M SUNE J YELAMOS D AYMERICH X
Citation: M. Nafria et al., HIGH-FIELD DYNAMIC STRESS OF THIN SIO2-FILMS, Microelectronics and reliability, 35(3), 1995, pp. 539-553
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