Citation: G. Yoon, FORECASTING WITH STRUCTURAL-CHANGE - WHY IS THE RANDOM-WALK MODEL SO DAMNED DIFFICULT TO BEAT, Applied economics letters, 5(1), 1998, pp. 41-42
Authors:
JEON KJ
LEE KH
KIM U
PARK SH
YOON G
EOM HS
KIM D
Citation: Kj. Jeon et al., MEASUREMENT OF THE OPTICAL COEFFICIENTS OF MULTIPLE-SCATTERING MEDIA FROM TIME-RESOLVED REFLECTANCE SPECTRA, Journal of the Korean Physical Society, 32(6), 1998, pp. 823-827
Citation: G. Yoon et Y. Epstein, CHARACTERIZATION OF HIGH-QUALITY NITRIDED GATE DIELECTRIC FILMS MANUFACTURED IN REDUCED PRESSURE FURNACE FOR ULTRALARGE SCALE INTEGRATION COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR APPLICATIONS, Journal of the Electrochemical Society, 145(5), 1998, pp. 1679-1683
Citation: H. Jeon et al., DEPENDENCE OF THE C49-C54 TISI2 PHASE-TRANSITION TEMPERATURE ON FILM THICKNESS AND SI SUBSTRATE ORIENTATION, Thin solid films, 299(1-2), 1997, pp. 178-182