Authors:
Kondrashov, PE
Smirnov, IS
Lukashov, YE
Yablokov, SY
Baranov, AM
Dowling, DP
Donnelly, K
Flood, RV
McConnell, ML
Citation: Pe. Kondrashov et al., Investigation of ultrathin DLC film growth by a novel X-ray reflectivity technique and in situ ellipsometry, DIAM RELAT, 8(2-5), 1999, pp. 532-537