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Results:
1-14
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Results: 14
Authors:
Tokuda, N
Murata, M
Hojo, D
Yamabe, K
Citation: N. Tokuda et al., SiO2 surface and SiO2/Si interface topography change by thermal oxidation, JPN J A P 1, 40(8), 2001, pp. 4763-4768
Authors:
Shimoyama, K
Kubo, K
Maeda, T
Yamabe, K
Citation: K. Shimoyama et al., Epitaxial growth of BaTiO3 thin film on SrTiO3 substrate in ultra high vacuum without introducing oxidant, JPN J A P 2, 40(5A), 2001, pp. L463-L464
Authors:
Wang, Q
Yamabe, K
Narita, J
Morishita, M
Ohsumi, Y
Kusano, K
Shirai, Y
Ogawa, HI
Citation: Q. Wang et al., Suppression of growth of putrefactive and food poisoning bacteria by lactic acid fermentation of kitchen waste, PROCESS BIO, 37(4), 2001, pp. 351-357
Authors:
Fujita, K
Nakatake, R
Yamabe, K
Watanabe, A
Asada, Y
Takegawa, K
Citation: K. Fujita et al., Identification of amino acid residues essential for the substrate specificity of Flavobacterium sp endo-beta-N-acetylglucosaminidase, BIOS BIOT B, 65(7), 2001, pp. 1542-1548
Authors:
Shimoyama, K
Kubo, K
Lida, M
Yamabe, K
Maeda, T
Citation: K. Shimoyama et al., Changes in surface states during epitaxial growth of BaTiO3 on SrTiO3 substrate in connection with composition deviation, J VAC SCI A, 19(5), 2001, pp. 2083-2088
Authors:
Kikuchi, H
Osoegawa, M
Ochi, H
Murai, H
Horiuchi, I
Takahashi, H
Yamabe, K
Iwaki, T
Mizutani, T
Oda, M
Kira, J
Citation: H. Kikuchi et al., Spinal cord lesions of myelitis with hyperIgEemia and mite antigen specific IgE (atopic myelitis) manifest eosinophilic inflammation, J NEUR SCI, 183(1), 2001, pp. 73-78
Authors:
Yamabe, K
Liao, K
Minemura, H
Murata, M
Citation: K. Yamabe et al., Nonuniform distribution of trapped charges in electron injection stressed SiO2 films, J ELCHEM SO, 148(2), 2001, pp. F9-F11
Authors:
Nakamizo, A
Nishio, S
Inamura, T
Koga, H
Yamabe, K
Kuba, H
Matsushima, T
Fukui, M
Citation: A. Nakamizo et al., Evolution of malignant cerebellar astrocytoma at the site of a treated medulloblastoma: Report of two cases, ACT NEUROCH, 143(7), 2001, pp. 697-700
Authors:
Yamabe, K
Citation: K. Yamabe, Special issue - Solid state devices & materials - Foreword, JPN J A P 1, 39(4B), 2000, pp. VIII-VIII
Authors:
Yamabe, K
Citation: K. Yamabe, Solid state devices & materials - Foreword, JPN J A P 1, 38(4B), 1999, pp. VIII-VIII
Surface microroughness observed during wet etching of silicon dioxide withhigh electric field stress
Authors:
Yamabe, K
Kai, L
Murata, M
Citation: K. Yamabe et al., Surface microroughness observed during wet etching of silicon dioxide withhigh electric field stress, JPN J A P 2, 38(12A), 1999, pp. L1453-L1456
Authors:
Shimoyama, K
Kanda, T
Iida, M
Maeda, T
Yamabe, K
Citation: K. Shimoyama et al., Flattening phenomenon observed during epitaxial growth of BaTiO3 by alternating deposition method, JPN J A P 2, 38(10A), 1999, pp. L1137-L1139
Authors:
Yamabe, K
Shimizu, S
Ito, T
Yoshioka, Y
Nomura, M
Narita, M
Saito, I
Kanegae, Y
Matsuda, H
Citation: K. Yamabe et al., Cancer gene therapy using a pro-apoptotic gene, caspase-3, GENE THER, 6(12), 1999, pp. 1952-1959
Authors:
Uchiyama, H
Matsumoto, K
Mchedlidze, T
Nisimura, M
Yamabe, K
Citation: H. Uchiyama et al., N+P junction leakage current caused by oxygen precipitation defects and its temperature dependence, J ELCHEM SO, 146(6), 1999, pp. 2322-2327
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1-14
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