Authors:
Hoffmann, P
Mikalo, RP
Yfantis, A
Batchelor, DR
Appel, G
Yfantis, D
Schmeisser, D
Citation: P. Hoffmann et al., A spectre-microscopic approach for thin film analysis: Grain boundaries inmc-Si and Sn/SnO2 nano particles, MIKROCH ACT, 136(3-4), 2001, pp. 109-113
Authors:
Yfantis, A
Appel, G
Schmeisser, D
Yfantis, D
Citation: A. Yfantis et al., Polypyrrole doped with fluoro-metal complexes: thermal stability and structural properties, SYNTH METAL, 106(3), 1999, pp. 187-195