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Mapping of the hot spots for DNA damage by one-electron oxidation: Efficacy of GG doublets and GGG triplets as a trap in long-range hole migration
Authors: Saito, I Nakamura, T Nakatani, K Yoshioka, Y Yamaguchi, K Sugiyama, H
Citation: I. Saito et al., Mapping of the hot spots for DNA damage by one-electron oxidation: Efficacy of GG doublets and GGG triplets as a trap in long-range hole migration, J AM CHEM S, 120(48), 1998, pp. 12686-12687
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