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ENG
Results:
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Results: 1
Temperature dependence of hot carrier induced MOSFET degradation at low gate bias
Authors:
Hong, SH Nam, SM Yun, BO Lee, BJ Yu, CG Park, JT
Citation:
Sh. Hong et al., Temperature dependence of hot carrier induced MOSFET degradation at low gate bias, MICROEL REL, 39(6-7), 1999, pp. 809-814
Risultati:
1-1
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