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Results: 1-9 |
Results: 9
ADSORPTION OF HYDROGEN ON CLEAN AND OXIDIZED BERYLLIUM STUDIED BY DIRECT RECOIL SPECTROMETRY
Authors: ZALKIND S POLAK M SHAMIR N
Citation: S. Zalkind et al., ADSORPTION OF HYDROGEN ON CLEAN AND OXIDIZED BERYLLIUM STUDIED BY DIRECT RECOIL SPECTROMETRY, Applied surface science, 115(3), 1997, pp. 273-278
THE ADSORPTION OF H2O VS O-2 ON BERYLLIUM
Authors: ZALKIND S POLAK M SHAMIR N
Citation: S. Zalkind et al., THE ADSORPTION OF H2O VS O-2 ON BERYLLIUM, Surface science, 385(2-3), 1997, pp. 318-327
SITE RELATED NUCLEATION AND GROWTH OF HYDRIDES ON URANIUM SURFACES
Authors: ARKUSH R VENKERT A AIZENSHTEIN M ZALKIND S MORENO D BRILL M MINTZ MH SHAMIR N
Citation: R. Arkush et al., SITE RELATED NUCLEATION AND GROWTH OF HYDRIDES ON URANIUM SURFACES, Journal of alloys and compounds, 244(1-2), 1996, pp. 197-205
PASSIVATION OF URANIUM METAL BY RADIOFREQUENCY PLASMA NITRIDING AGAINST GAS-PHASE (H-2, H2O) CORROSION
Authors: RAVEH A ARKUSH R ZALKIND S BRILL M
Citation: A. Raveh et al., PASSIVATION OF URANIUM METAL BY RADIOFREQUENCY PLASMA NITRIDING AGAINST GAS-PHASE (H-2, H2O) CORROSION, Surface & coatings technology, 82(1-2), 1996, pp. 38-41
PHYSICAL DISCONTINUITIES IN THE SURFACE MICROSTRUCTURE OF URANIUM ALLOYS AS PREFERRED SITES FOR HYDROGEN ATTACK
Authors: MORENO D ARKUSH R ZALKIND S SHAMIR N
Citation: D. Moreno et al., PHYSICAL DISCONTINUITIES IN THE SURFACE MICROSTRUCTURE OF URANIUM ALLOYS AS PREFERRED SITES FOR HYDROGEN ATTACK, Journal of nuclear materials, 230(2), 1996, pp. 181-186
THE INFLUENCE OF PREFERRED CRYSTALLOGRAPHIC ORIENTATION ON BLISTER SIZE DISTRIBUTION IN HELIUM IMPLANTED SURFACES
Authors: ZALKIND S LEMPERT GD MORENO D
Citation: S. Zalkind et al., THE INFLUENCE OF PREFERRED CRYSTALLOGRAPHIC ORIENTATION ON BLISTER SIZE DISTRIBUTION IN HELIUM IMPLANTED SURFACES, Scripta metallurgica et materialia, 31(2), 1994, pp. 225-230
IN-SITU X-RAY-DIFFRACTION MEASUREMENTS OF SILICIDE FORMATION IN THE CO-SI SYSTEM
Authors: ZALKIND S PELLAG J ZEVIN L DITCHEK BM
Citation: S. Zalkind et al., IN-SITU X-RAY-DIFFRACTION MEASUREMENTS OF SILICIDE FORMATION IN THE CO-SI SYSTEM, Thin solid films, 249(2), 1994, pp. 187-194
SILICIDE FORMATION IN THE CO-SI SYSTEM BY RAPID THERMAL ANNEALING
Authors: PELLEG J ZALKIND S ZEVIN L DITCHEK BM
Citation: J. Pelleg et al., SILICIDE FORMATION IN THE CO-SI SYSTEM BY RAPID THERMAL ANNEALING, Thin solid films, 249(1), 1994, pp. 126-131
STRESS-CORROSION CRACKING OF U-0.1-PERCENT-CR IN HUMID HELIUM ATMOSPHERE
Authors: ZALKIND S ESHKENAZY R HARUSH S HALPERIN D MORENO D ABRAMOV E VENKERT A
Citation: S. Zalkind et al., STRESS-CORROSION CRACKING OF U-0.1-PERCENT-CR IN HUMID HELIUM ATMOSPHERE, Journal of nuclear materials, 209(2), 1994, pp. 169-173
Risultati: 1-9 |