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Results: 4

Authors: HUANG MQ LAI PT XU JP ZENG SH LI GQ CHENG YC
Citation: Mq. Huang et al., SUPPRESSION OF HOT-ELECTRON-INDUCED INTERFACE DEGRADATION IN METAL-OXIDE-SEMICONDUCTOR DEVICES BY BACKSURFACE ARGON BOMBARDMENT, Microelectronics and reliability, 38(9), 1998, pp. 1407-1411

Authors: LI GQ LAI PT ZENG SH HUANG MC CHENG YC
Citation: Gq. Li et al., PHOTOSENSITIVITY, THERMAL AND HUMIDITY SENSITIVITY CHARACTERISTICS OFSR1-XLAXTIO3 FILM ON SIO2 SI SUBSTRATE/, Sensors and actuators. A, Physical, 63(3), 1997, pp. 223-226

Authors: LAI PT HUANG MQ ZENG X ZENG SH LI GQ
Citation: Pt. Lai et al., INFLUENCE OF BACKSURFACE ARGON BOMBARDMENT ON SIO2-SI INTERFACE CHARACTERISTICS, Applied physics letters, 68(19), 1996, pp. 2687-2689

Authors: LI GQ LAI PT ZENG SH HUANG MQ LIU BY
Citation: Gq. Li et al., EFFECTS OF CHEMICAL-COMPOSITION ON HUMIDITY SENSITIVITY OF AL BATIO3/SI STRUCTURE/, Applied physics letters, 66(18), 1995, pp. 2436-2438
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