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Authors: PALOURA EC GINOUDI A MARKWITZ A LIOUTAS C KATSIKINI M BETHGE K AMINPIROOZ S ROSSNER H HOLUBKRAPPE E ZORBA T SIAPKAS D
Citation: Ec. Paloura et al., MICROSTRUCTURAL CHARACTERIZATION OF STOICHIOMETRIC BURIED SI3N4 FILMS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 113(1-4), 1996, pp. 227-230

Authors: SIAPKAS DI HATZOPOULOS N KATSIDIS CC ZORBA T MITSAS CL HEMMENT PLF
Citation: Di. Siapkas et al., STRUCTURAL AND COMPOSITIONAL CHARACTERIZATION OF HIGH-ENERGY SEPARATION BY IMPLANTATION OF OXYGEN STRUCTURES USING INFRARED-SPECTROSCOPY, Journal of the Electrochemical Society, 143(9), 1996, pp. 3019-3032

Authors: ZORBA T SIAPKAS DI KATSIDIS CC
Citation: T. Zorba et al., OPTICAL CHARACTERIZATION OF THIN AND ULTRATHIN SURFACE AND BURIED CUBIC SIC LAYERS USING FTIR SPECTROSCOPY, Microelectronic engineering, 28(1-4), 1995, pp. 229-232
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