Authors: WANG TH ZOUS NK LAI JL HUANG CM

Citation: Th. Wang et al., HOT HOLE STRESS-INDUCED LEAKAGE CURRENT (SILC) TRANSIENT IN TUNNEL OXIDES, IEEE electron device letters, 19(11), 1998, pp. 411-413

Authors: WANG TH CHIANG LP ZOUS NK CHANG TE HUANG C

Citation: Th. Wang et al., CHARACTERIZATION OF VARIOUS STRESS-INDUCED OXIDE TRAPS IN MOSFETS BY USING A SUBTHRESHOLD TRANSIENT CURRENT TECHNIQUE, I.E.E.E. transactions on electron devices, 45(8), 1998, pp. 1791-1796

Authors: WANG TH CHANG TE CHIANG LP WANG CH ZOUS NK HUANG CM

Citation: Th. Wang et al., INVESTIGATION OF OXIDE CHARGE TRAPPING AND DETRAPPING IN A MOSFET BY USING A GIDL CURRENT TECHNIQUE, I.E.E.E. transactions on electron devices, 45(7), 1998, pp. 1511-1517

Authors: CHIANG LP ZOUS NK WANG TH CHANG TE SHEN KY HUANG C

Citation: Lp. Chiang et al., FIELD AND TEMPERATURE EFFECTS ON OXIDE CHARGE DETRAPPING IN A METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR BY MEASURING A SUBTHRESHOLDCURRENT TRANSIENT, Applied physics letters, 71(8), 1997, pp. 1068-1070