Authors:
Harame, DL
Ahlgren, DC
Coolbaugh, DD
Dunn, JS
Freeman, GG
Gillis, JD
Groves, RA
Hendersen, GN
Johnson, RA
Joseph, AJ
Subbanna, S
Victor, AM
Watson, KM
Webster, CS
Zampardi, PJ
Citation: Dl. Harame et al., Current status and future trends of SiGeBiCMOS technology, IEEE DEVICE, 48(11), 2001, pp. 2575-2594
Authors:
Rosenthal, PA
Yu, ET
Pierson, RL
Zampardi, PJ
Citation: Pa. Rosenthal et al., Characterization of AlxGa1-xAs/GaAs heterojunction bipolar transistor structures using cross-sectional scanning force microscopy, J APPL PHYS, 87(4), 2000, pp. 1937-1942
Authors:
Zampardi, PJ
Runge, K
Pierson, RL
Higgins, JA
Yu, R
McDermott, BT
Pan, N
Citation: Pj. Zampardi et al., Heterostructure-based high-speed/high-frequency electronic circuit applications, SOL ST ELEC, 43(8), 1999, pp. 1633-1643