Authors: Shih, PS Zan, HW Chang, TC Huang, TY Chang, CY

Citation: Ps. Shih et al., Dimensional effects on the drain current of n- and p-channel polycrystalline silicon thin film transistors, JPN J A P 1, 39(7A), 2000, pp. 3879-3882

Authors: Zan, HW Shih, PS Chang, TC Chang, CY

Citation: Hw. Zan et al., Dimensional effects on the reliability of polycrystalline silicon thin-film transistors, MICROEL REL, 40(8-10), 2000, pp. 1479-1483