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Results: 1-2 |
Results: 2
XRF analysis of powder microsamples of multielement mono- and polycrystals. Determination of Cr, Mn, Ni, Cu, Zn, Ga, As, Se, Sb, Yb
Authors: Jurczyk, J Sitko, R Zawisza, B
Citation: J. Jurczyk et al., XRF analysis of powder microsamples of multielement mono- and polycrystals. Determination of Cr, Mn, Ni, Cu, Zn, Ga, As, Se, Sb, Yb, CHEM ANAL, 45(3), 2000, pp. 415-428
XRF analysis of microsamples of semiconductor type multielement materials by the thin layer method. Determination of Cr, Co, Ni, Cu, Zn, Ga, Se, Sb, Yb
Authors: Jurczyk, J Sitko, R Zawisza, B Buhl, F Malicka, E
Citation: J. Jurczyk et al., XRF analysis of microsamples of semiconductor type multielement materials by the thin layer method. Determination of Cr, Co, Ni, Cu, Zn, Ga, Se, Sb, Yb, MIKROCH ACT, 132(1), 1999, pp. 41-47
Risultati: 1-2 |