Citation: Rt. Zhang et al., Stochastic interconnect modeling, power trends, and performance characterization of 3-D circuits, IEEE DEVICE, 48(4), 2001, pp. 638-652
Authors:
Zhang, RT
Marone, PA
Thiyagarajan, P
Tiede, DM
Citation: Rt. Zhang et al., Structure and molecular fluctuations of n-alkyl-beta-D-glucopyranoside micelles determined by X-ray and neutron scattering, LANGMUIR, 15(22), 1999, pp. 7510-7519