Citation: Bv. Zhmud et al., Application of charge regulation model for evaluation of surface ionization parameters from atomic force microscopy (AFM) data, COLL SURF A, 164(1), 2000, pp. 3-7
Authors:
House, WA
Denison, FH
Warwick, MS
Zhmud, BV
Citation: Wa. House et al., Dissolution of silica and the development of concentration profiles in freshwater sediments, APPL GEOCH, 15(4), 2000, pp. 425-438
Citation: Bv. Zhmud et al., Dynamic surface tension in concentrated solutions of CnEm surfactants: A comparison between the theory and experiment, LANGMUIR, 16(6), 2000, pp. 2557-2565
Citation: Bv. Zhmud et al., Influence of chemical pretreatment on the surface properties of silicon nitride powder, COLL SURF A, 158(3), 1999, pp. 327-341