Authors: Zielinska-Rohozinska, E Gronkowski, J Pakula, K Majer, M Regulska, M Nowicki, L

Citation: E. Zielinska-rohozinska et al., Strain relaxation in Ga1-xInxN thin layers grown on GaN sublayers, J ALLOY COM, 328(1-2), 2001, pp. 199-205

Authors: Zielinska-Rohozinska, E Gronkowski, J Regulska, M Majer, M Pakula, K

Citation: E. Zielinska-rohozinska et al., X-ray diffraction study of composition inhomogeneities in Ga1-xInxN thin layers, CRYST RES T, 36(8-10), 2001, pp. 903-910

Authors: Slupinski, T Zielinska-Rohozinska, E

Citation: T. Slupinski et E. Zielinska-rohozinska, Local order of Te impurity atoms and free electron concentration in heavily doped GaAs : Te, THIN SOL FI, 367(1-2), 2000, pp. 227-231

Authors: Gronkowski, J Borowski, J Zielinska-Rohozinska, E

Citation: J. Gronkowski et al., High-resolution characterization of microdefects by X-ray diffuse scattering, PHI T ROY A, 357(1761), 1999, pp. 2721-2729