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Citation: L. Tikana et al., SiNx-submicrometer coatings: Optimization of film properties, ADV ENG MAT, 2(1-2), 2000, pp. 53-56

Authors: Zahn, W Zosch, A

Citation: W. Zahn et A. Zosch, The dependence of fractal dimension on measuring conditions of scanning probe microscopy, FRESEN J AN, 365(1-3), 1999, pp. 168-172

Authors: Tikana, L Pohl, M Zosch, A Zahn, W Wuttke, W

Citation: L. Tikana et al., SiNx-submicrometer coatings - Optimization of the film properties, MATER WERKS, 30(2), 1999, pp. 72-76