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Results:
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Results: 2
Analysis of SiO2 thin films deposited by PECVD using an oxygen-TEOS-argon mixture
Authors:
Viana, CE da Silva, ANR Morimoto, NI Bonnaud, O
Citation:
Ce. Viana et al., Analysis of SiO2 thin films deposited by PECVD using an oxygen-TEOS-argon mixture, BRAZ J PHYS, 31(2), 2001, pp. 299-303
Tetraethylorthosilicate SiO2 films deposited at a low temperature
Authors:
da Silva, ANR Morimoto, NI Bonnaud, O
Citation:
Anr. Da Silva et al., Tetraethylorthosilicate SiO2 films deposited at a low temperature, MICROEL REL, 40(4-5), 2000, pp. 621-624
Risultati:
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