Authors:
de Almeida, P
Schaublin, R
Almazouzi, A
Victoria, M
Levy, F
Citation: P. De Almeida et al., Microstructure and growth modes of stoichiometric NiAl and Ni3Al thin films deposited by r.f.-magnetron sputtering, THIN SOL FI, 368(1), 2000, pp. 26-34
Authors:
de Almeida, P
Schaublin, R
Almazouzi, A
Victoria, M
Dobeli, M
Citation: P. De Almeida et al., Quantitative long-range-order measurement and disordering efficiency estimation in ion-irradiated bulk Ni3Al using cross-sectional conventional transmission electron microscopy, APPL PHYS L, 77(17), 2000, pp. 2680-2682