Authors:
Monaghan, ML
Nigam, T
Houssa, M
De Gendt, S
Urbach, HP
de Bokx, PK
Citation: Ml. Monaghan et al., Characterization of silicon oxynitride films by grazing-emission X-ray fluorescence spectrometry, THIN SOL FI, 359(2), 2000, pp. 197-202
Authors:
Tsuji, K
Takenaka, H
Wagatsuma, K
de Bokx, PK
Van Grieken, RE
Citation: K. Tsuji et al., Enhancement of X-ray fluorescence intensity from an ultra-thin sandwiched layer at grazing-emission angles, SPECT ACT B, 54(13), 1999, pp. 1881-1888