Authors: Temst, K Van Bael, MJ Van Haesendonck, C Bruynseraede, Y de Groot, DG Koeman, N Griessen, R

Citation: K. Temst et al., An X-ray diffraction study of interface roughness and diffusion in Ag/Pd superlattices, THIN SOL FI, 342(1-2), 1999, pp. 174-179