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Citation: Jd. Kamminga et al., On the origin of stress in magnetron sputtered TiN layers, J APPL PHYS, 88(11), 2000, pp. 6332-6345

Authors: Kamminga, JD de Keijser, TH Mittemeijer, EJ Delhez, R

Citation: Jd. Kamminga et al., New methods for diffraction stress measurement: a critical evaluation of new and existing methods, J APPL CRYS, 33, 2000, pp. 1059-1066

Authors: Velterop, L Delhez, R de Keijser, TH Mittemeijer, EJ Reefman, D

Citation: L. Velterop et al., X-ray diffraction analysis of stacking and twin faults in f.c.c. metals: arevision and allowance for texture and non-uniform fault probabilities, J APPL CRYS, 33, 2000, pp. 296-306

Authors: Kamminga, JD Delhez, R de Keijser, TH Mittemeijer, EJ

Citation: Jd. Kamminga et al., A tool for X-ray diffraction analysis of thin layers on substrates: substrate peak removal method, J APPL CRYS, 33, 2000, pp. 108-111