Authors: Ferlet-Cavrois, V Colladant, T Paillet, P Leray, JL Musseau, O Schwank, JR Shaneyfelt, MR Pelloie, JL de Poncharra, JD

Citation: V. Ferlet-cavrois et al., Worst-case bias during total dose irradiation of SOI transistors, IEEE NUCL S, 47(6), 2000, pp. 2183-2188