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Results: 1
Impact of probe-to-pad contact degradation on the high frequency characteristics of RF MOSFETs and guidelines to avoid it
Authors:
Vandamme, EP Schreurs, D van Dinther, C
Citation:
Ep. Vandamme et al., Impact of probe-to-pad contact degradation on the high frequency characteristics of RF MOSFETs and guidelines to avoid it, INT J RF MI, 11(3), 2001, pp. 114-120
Risultati:
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