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Citation: D. Van Effenterre et al., Binary separation in very thin nematic films: Thickness and phase coexistence - art. no. 125701, PHYS REV L, 8712(12), 2001, pp. 5701

Authors: Zhang, JX Zhang, TC van Effenterre, D Xie, CD Peng, KC

Citation: Jx. Zhang et al., Experimental realization of quantum nondemolition measurement by series-coupled light emitter diodes, ACT PHY C E, 49(2), 2000, pp. 226-230