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Results: 1-7 |
Results: 7

Authors: van de Weijer, J van Vliet, LJ Verbeek, PW van Ginkel, M
Citation: J. Van De Weijer et al., Curvature estimation in oriented patterns using curvilinear models appliedto gradient vector fields, IEEE PATT A, 23(9), 2001, pp. 1035-1042

Authors: van den Doel, LR van Vliet, LJ
Citation: Lr. Van Den Doel et Lj. Van Vliet, Temporal phase-unwrapping algorithm for dynamic interference pattern analysis in interference-contrast microscopy, APPL OPTICS, 40(25), 2001, pp. 4487-4500

Authors: van Kempen, GMP van Vliet, LJ
Citation: Gmp. Van Kempen et Lj. Van Vliet, Background estimation in nonlinear image restoration, J OPT SOC A, 17(3), 2000, pp. 425-433

Authors: van Kempen, GMP van Vliet, LJ
Citation: Gmp. Van Kempen et Lj. Van Vliet, Mean and variance of ratio estimators used in fluorescence ratio imaging, CYTOMETRY, 39(4), 2000, pp. 300-305

Authors: van Kempen, GMP van Vliet, LJ
Citation: Gmp. Van Kempen et Lj. Van Vliet, The influence of the regularization parameter and the first estimate on the performance of Tikhonov regularized non-linear image restoration algorithms, J MICROSC O, 198, 2000, pp. 63-75

Authors: de Ridder, D Duin, RPW Verbeek, PW van Vliet, LJ
Citation: D. De Ridder et al., The applicability of neural networks to non-linear image processing, PATTERN A A, 2(2), 1999, pp. 111-128

Authors: Meinders, ER van Kempen, GMP van Vliet, LJ van der Meer, TH
Citation: Er. Meinders et al., Measurement and application of an infrared image restoration filter to improve the accuracy of surface temperature measurements of cubes, EXP FLUID, 26(1-2), 1999, pp. 86-96
Risultati: 1-7 |