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Citation: Ca. Schrama et al., Monochromator-based cryogenic radiometry between 1 mu m and 20 mu m, METROLOGIA, 37(5), 2000, pp. 567-570

Authors: Schrama, CA van der Ham, EWM

Citation: Ca. Schrama et Ewm. Van Der Ham, Sampling period criterion in a scanning-beam technique, APPL OPTICS, 39(10), 2000, pp. 1500-1504

Authors: Eliel, ER van der Ham, EWM Vrehen, QHF

Citation: Er. Eliel et al., Enhancing the yield in surface sum-frequency generation by the use of surface polaritons, APP PHYS B, 68(3), 1999, pp. 349-353

Authors: van der Ham, EWM Vrehen, QHE Eliel, ER Yakovlev, VA Valieva, EV Kuzik, LA Petrov, JE Sychugov, VA van der Meer, AFG

Citation: Ewm. Van Der Ham et al., Giant enhancement of sum-frequency yield by surface-plasmon excitation, J OPT SOC B, 16(7), 1999, pp. 1146-1152

Authors: Braun, R Casson, BD Bain, CD van der Ham, EWM Vrehen, QHF Eliel, ER Briggs, AM Davies, PB

Citation: R. Braun et al., Sum-frequency generation from thiophenol on silver in the mid and far-IR, J CHEM PHYS, 110(9), 1999, pp. 4634-4640