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Results:
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Results: 10
Authors:
van der Lee, A
Hamon, L
Holl, Y
Grohens, Y
Citation: A. Van Der Lee et al., Density profiles in thin PMMA supported films investigated by X-ray reflectometry, LANGMUIR, 17(24), 2001, pp. 7664-7669
Authors:
van der Lee, A
Roualdes, S
Berjoan, R
Durand, J
Citation: A. Van Der Lee et al., Mass density determination of thin organosilicon films by X-ray reflectometry, APPL SURF S, 173(1-2), 2001, pp. 115-121
Authors:
van der Lee, A
Citation: A. Van Der Lee, Experimental feasibility of phaseless inverse scattering methods for specular reflectivity, EUR PHY J B, 13(4), 2000, pp. 755-763
Authors:
van der Lee, A
Citation: A. Van Der Lee, Grazing incidence specular reflectivity: theory, experiment, and applications, SOLID ST SC, 2(2), 2000, pp. 257-278
Authors:
van der Lee, A
Citation: A. Van Der Lee, Practical aspects of inverse scattering methods applied to specular reflectivity data, PHYSICA B, 283(1-3), 2000, pp. 273-277
Authors:
Boissiere, C
Larbot, A
van der Lee, A
Kooyman, PJ
Prouzet, E
Citation: C. Boissiere et al., A new synthesis of mesoporous MSU-X silica controlled by a two-step pathway, CHEM MATER, 12(10), 2000, pp. 2902-2913
Authors:
Vallee, C
Goullet, A
Granier, A
van der Lee, A
Durand, J
Marliere, C
Citation: C. Vallee et al., Inorganic to organic crossover in thin films deposited from O-2/TEOS plasmas, J NON-CRYST, 272(2-3), 2000, pp. 163-173
Authors:
Boissiere, C
van der Lee, A
El Mansouri, A
Larbot, A
Prouzet, E
Citation: C. Boissiere et al., A double step synthesis of mesoporous micrometric spherical MSU-X silica particles, CHEM COMMUN, (20), 1999, pp. 2047-2048
Authors:
Roualdes, S
Hovnanian, N
van der Lee, A
Sanchez, J
Durand, J
Citation: S. Roualdes et al., Hybrid plasma polymerized membranes from organosilicon precursors for gas separation, J PHYS IV, 9(P8), 1999, pp. 1147-1154
Authors:
van der Lee, A
Durand, J
Cot, D
Vazquez, L
Citation: A. Van Der Lee et al., Study of the growth mechanism of CVD silicon films on silica by X-ray reflectivity, atomic force microscopy and scanning electron microscopy, J PHYS IV, 9(P8), 1999, pp. 157-164
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1-10
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