EMITTER UTILIZATION IN HETEROJUNCTION BIPOLAR-TRANSISTORS

Citation
T. Quach et al., EMITTER UTILIZATION IN HETEROJUNCTION BIPOLAR-TRANSISTORS, Solid-state electronics, 41(9), 1997, pp. 1303-1308
Citations number
8
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
41
Issue
9
Year of publication
1997
Pages
1303 - 1308
Database
ISI
SICI code
0038-1101(1997)41:9<1303:EUIHB>2.0.ZU;2-F
Abstract
We compare measured collector current densities, cutoff frequencies (f (t)), and transducer gains for thermally shunted heterojunction bipola r transistors with 2-16 mu m emitter dot diameters or 2-8 mu m emitter bar widths with models of the emitter utilization factors. Models tha t do not take emitter resistance into account predict that the d.c. ut ilization factors are below 0.7 for collector current densities greate r than 6 x 10(4) A cm(-2) and emitter diameters or widths greater than 8 mu m. However, because the current gains are compressed by the emit ter resistances at those current densities, the measured utilization f actors are close to 1, which agrees with models that include emitter r esistance. A.c. utilization factors are evident in the transistor Y pa rameters. For example, Re\Y-21\ drops off at high frequencies more ste eply in HBTs with large emitter diameters or widths than in small ones . However, measured data shows that the HBT a.c. current gains h(21) o r f(t) values are not influenced by the a.c. utilization factor. A.c. utilization effects on HBT performance parameters such as small signal and power gains, output power, and power added efficiency are also ex amined. Published by Elsevier Science Ltd.