GROWTH AND STRUCTURE OF ELECTRON-BEAM EVAPORATED V2O5 THIN-FILMS

Authors
RAMANA CV HUSSAIN OM NAIDU BS
Citation
Cv. Ramana et al., GROWTH AND STRUCTURE OF ELECTRON-BEAM EVAPORATED V2O5 THIN-FILMS, Materials chemistry and physics, 50(3), 1997, pp. 195-199
Citations number
25
Categorie Soggetti
Material Science
Journal title
Materials chemistry and physics → ACNP
ISSN journal
02540584
Volume
50
Issue
3
Year of publication
1997
Pages
195 - 199
Database
ISI
SICI code
0254-0584(1997)50:3<195:GASOEE>2.0.ZU;2-V
Abstract
The growth, structure and room temperature electrical conductivity of electron beam evaporated V2O5 thin films were studied in detail as a f unction of deposition temperature. The films deposited at T-s approxim ate to 553 K and subsequently annealed in oxygen atmosphere at 693 K e xhibited orthorhombic layered structure. (C) 1997 Elsevier Science S.A .