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Results: 1-25/1174
Authors:
CHU PK
CHEUNG NW
Citation: Pk. Chu et Nw. Cheung, MICROCAVITY ENGINEERING BY PLASMA IMMERSION ION-IMPLANTATION, Materials chemistry and physics, 57(1), 1998, pp. 1-16
Authors:
LEE C
SHIN YH
Citation: C. Lee et Yh. Shin, TA-SI-N AS A DIFFUSION BARRIER BETWEEN CU AND SI, Materials chemistry and physics, 57(1), 1998, pp. 17-22
Authors:
ZHANG LH
KOKA RV
Citation: Lh. Zhang et Rv. Koka, A STUDY ON THE OXIDATION AND CARBON DIFFUSION OF TIC IN ALUMINA TITANIUM CARBIDE CERAMICS USING XPS AND RAMAN-SPECTROSCOPY, Materials chemistry and physics, 57(1), 1998, pp. 23-32
Authors:
SHIAU FS
FANG TT
LEU TH
Citation: Fs. Shiau et al., EFFECTS OF MILLING AND PARTICLE-SIZE DISTRIBUTION ON THE SINTERING BEHAVIOR AND THE EVOLUTION OF THE MICROSTRUCTURE IN SINTERING POWDER COMPACTS, Materials chemistry and physics, 57(1), 1998, pp. 33-40
Authors:
HUANG BR
YANG KY
WU CH
HO TJ
PENG WS
Citation: Br. Huang et al., THE OXYGENATED PHENOMENA OF THE UNDOPED LARGE-GRAIN AND SMALL-GRAIN POLYCRYSTALLINE DIAMOND FILMS, Materials chemistry and physics, 57(1), 1998, pp. 41-46
Authors:
TSAI MS
TSENG TY
Citation: Ms. Tsai et Ty. Tseng, EFFECT OF BOTTOM ELECTRODES ON DIELECTRIC-RELAXATION AND DEFECT ANALYSIS OF (BA0.47SR0.53)TIO3 THIN-FILM CAPACITORS, Materials chemistry and physics, 57(1), 1998, pp. 47-56
Authors:
DAS VD
GANESAN PG
Citation: Vd. Das et Pg. Ganesan, THICKNESS AND TEMPERATURE EFFECTS ON THERMOELECTRIC-POWER AND ELECTRICAL-RESISTIVITY OF (BI0.25SB0.75)(2)TE-3 THIN-FILMS, Materials chemistry and physics, 57(1), 1998, pp. 57-66
Authors:
LEE CH
YANG DI
JEON GN
KANG HS
CHAE KW
DO HY
Citation: Ch. Lee et al., GAN EPILAYER ON SEPARATELY DEPOSITED BUFFER LAYER BY HOT-WALL EPITAXY, Materials chemistry and physics, 57(1), 1998, pp. 67-71
Authors:
MUKERJI S
KAR T
Citation: S. Mukerji et T. Kar, THERMAL AND SPECTROSCOPIC STUDIES OF AS-GROWN L-ARGININE HYDROCHLORIDE MONOHYDRATE CRYSTALS, Materials chemistry and physics, 57(1), 1998, pp. 72-76
Authors:
LIN PH
CHENG SY
CHANG WL
PAN HJ
SHIE YH
LIU WC
TSAI JH
Citation: Ph. Lin et al., INVESTIGATION OF AN ALINAS GAINAS SUPERLATTICE-CONFINED EMITTER BIPOLAR-TRANSISTOR (SCEBT)/, Materials chemistry and physics, 57(1), 1998, pp. 77-80
Authors:
LIU R
XUAN Y
JIA YQ
Citation: R. Liu et al., ORDERING AND DISORDERING IN (A'A'') (B'B'') O-3-TYPE PEROVSKITE COMPOUNDS, Materials chemistry and physics, 57(1), 1998, pp. 81-85
Authors:
PATIL SA
MAHAJAN VC
GHATAGE AK
LOTKE SD
Citation: Sa. Patil et al., STRUCTURE AND MAGNETIC-PROPERTIES OF CD AND TI SI SUBSTITUTED COBALT FERRITES/, Materials chemistry and physics, 57(1), 1998, pp. 86-91
Authors:
DUAN RG
LIANG KM
GU SR
Citation: Rg. Duan et al., EFFECT OF NA-CENTER-DOT-12AL(2)O(3)CENTER-DOT-61SIO(2) GLASS( ION ON THE STRUCTURE OF 27CAO), Materials chemistry and physics, 57(1), 1998, pp. 92-94
Authors:
LO JR
TSENG TY
Citation: Jr. Lo et Ty. Tseng, EFFECT OF LICL ON THE CRYSTALLIZATION BEHAVIOR AND LUMINESCENCE OF Y3AL5O12-TB, Materials chemistry and physics, 57(1), 1998, pp. 95-98
Authors:
YE DY
TONG XY
YAO LJ
YIN XX
Citation: Dy. Ye et al., FATIGUE HARDENING SOFTENING BEHAVIOR INVESTIGATED THROUGH VICKERS MICROHARDNESS MEASUREMENT DURING HIGH-CYCLE FATIGUE, Materials chemistry and physics, 56(3), 1998, pp. 199-204
Authors:
KASPEREK J
VERCHERE D
JACQUET D
PHILLIPS N
Citation: J. Kasperek et al., ANALYSIS OF THE CORROSION PRODUCTS ON GALVANIZED STEELS BY FTIR SPECTROSCOPY, Materials chemistry and physics, 56(3), 1998, pp. 205-213
Authors:
YEN SK
HUANG TY
Citation: Sk. Yen et Ty. Huang, CHARACTERIZATION OF THE ELECTROLYTIC ZRO2 COATING ON TI-6AL-4V, Materials chemistry and physics, 56(3), 1998, pp. 214-221
Authors:
HWANG KS
Citation: Ks. Hwang, EFFECT OF SUBSTRATES ON EPITAXY OF BI4TI3O12 THIN-FILMS BY DIPPING-PYROLYSIS PROCESS, Materials chemistry and physics, 56(3), 1998, pp. 222-225
Authors:
KOO HS
TSENG TY
Citation: Hs. Koo et Ty. Tseng, PREPARATION AND CHARACTERISTICS OF BI-PB-SR-CA-CU-O SUPERCONDUCTING FILMS BY SPRAY-PYROLYSIS AND POSTANNEALING, Materials chemistry and physics, 56(3), 1998, pp. 226-235
Authors:
ELMANSY MK
Citation: Mk. Elmansy, ELECTRICAL-CONDUCTION AND DIELECTRIC-RELAXATION IN VANADIUM PHOSPHATE-GLASSES, Materials chemistry and physics, 56(3), 1998, pp. 236-242
Authors:
KUMAR A
PATNAIK SK
SINGH MM
Citation: A. Kumar et al., CORROSION INHIBITION OF NICKEL IN 4-PERCENT NITRIC-ACID BY SUBSTITUTED THIONE COMPOUNDS, Materials chemistry and physics, 56(3), 1998, pp. 243-248
Authors:
YOON SF
ZHENG HQ
Citation: Sf. Yoon et Hq. Zheng, MOLECULAR-BEAM EPITAXIAL-GROWTH OF HIGH-QUALITY INP LAYERS FROM SOLIDPHOSPHORUS USING A VALVED PHOSPHORUS CRACKER CELL, Materials chemistry and physics, 56(3), 1998, pp. 249-255
Authors:
LEU IC
LU YM
HON MH
Citation: Ic. Leu et al., FACTORS DETERMINING THE DIAMETER OF SILICON-CARBIDE WHISKERS PREPAREDBY CHEMICAL-VAPOR-DEPOSITION, Materials chemistry and physics, 56(3), 1998, pp. 256-261
Authors:
ANGELES C
ROSAS G
PEREZ R
Citation: C. Angeles et al., MICROSTRUCTURAL AND CHEMICAL CHARACTERIZATION OF AL3TI ALLOY OBTAINEDWITH A RAPID SOLIDIFICATION TECHNIQUE, Materials chemistry and physics, 56(3), 1998, pp. 262-265
Authors:
SU LY
WANG H
LU ZH
Citation: Ly. Su et al., ALL-SOLID-STATE ELECTROCHROMIC WINDOW OF PRUSSIAN BLUE AND ELECTRODEPOSITED WO3 FILM WITH POLY(ETHYLENE OXIDE) GEL ELECTROLYTE, Materials chemistry and physics, 56(3), 1998, pp. 266-270