ON-WAFER TESTING OF ICS USING FREE-RUNNING OPTOELECTRONIC SAMPLING AND CAPACITIVE COUPLING

Authors
SARGSJAN G HEMPEL K ALTMANN B BERGNER H
Citation
G. Sargsjan et al., ON-WAFER TESTING OF ICS USING FREE-RUNNING OPTOELECTRONIC SAMPLING AND CAPACITIVE COUPLING, Microelectronic engineering, 34(2), 1997, pp. 187-194
Citations number
7
Categorie Soggetti
Optics,"Physics, Applied","Engineering, Eletrical & Electronic
Journal title
Microelectronic engineering → ACNP
ISSN journal
01679317
Volume
34
Issue
2
Year of publication
1997
Pages
187 - 194
Database
ISI
SICI code
0167-9317(1997)34:2<187:OTOIUF>2.0.ZU;2-X
Abstract
A new optoelectronic sampling technique is presented. The technique is simple and overcomes many considerable difficulties with other sampli ng techniques such as electro-optic sampling or optoelectronic samplin g using photoconductive switching. The combination of a high speed dio de with a load transistor or only one dual gate field effect transisto r may be used as signal mixing output device for high frequency testin g directly on the wafer.