POWER MOS DEVICES - STRUCTURE EVOLUTIONS AND MODELING APPROACHES

Citation
P. Rossel et al., POWER MOS DEVICES - STRUCTURE EVOLUTIONS AND MODELING APPROACHES, Microelectronics and reliability, 37(9), 1997, pp. 1375-1388
Citations number
120
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00262714
Volume
37
Issue
9
Year of publication
1997
Pages
1375 - 1388
Database
ISI
SICI code
0026-2714(1997)37:9<1375:PMD-SE>2.0.ZU;2-B
Abstract
In this survey paper, the historical evolution of power MOS transistor structures is presented and mostly used actual devices are described. General considerations on current and voltage capabilities are discus sed and configuration of popular structures is given. It then presents a synthesis of different modelling approaches proposed in recent year s. These include analytical solutions for basic electrical parameters, e.g. threshold voltage, on resistance, saturation and quasi-saturatio n effects, temperature impact and voltage handling capability. The num erical solutions of basic semiconductor devices are then briefly descr ibed along with some typical problems which can be solved this way. Th e compact circuit modelling method is finally explained with emphasis on dynamic behaviour modelling. Physical numerical models are detailed together with those intended for circuit simulation. A fairly exhaust ive bibliography is given for completeness. (C) 1995 IEEE. Published b y Elsevier Science Ltd.