In this survey paper, the historical evolution of power MOS transistor
structures is presented and mostly used actual devices are described.
General considerations on current and voltage capabilities are discus
sed and configuration of popular structures is given. It then presents
a synthesis of different modelling approaches proposed in recent year
s. These include analytical solutions for basic electrical parameters,
e.g. threshold voltage, on resistance, saturation and quasi-saturatio
n effects, temperature impact and voltage handling capability. The num
erical solutions of basic semiconductor devices are then briefly descr
ibed along with some typical problems which can be solved this way. Th
e compact circuit modelling method is finally explained with emphasis
on dynamic behaviour modelling. Physical numerical models are detailed
together with those intended for circuit simulation. A fairly exhaust
ive bibliography is given for completeness. (C) 1995 IEEE. Published b
y Elsevier Science Ltd.