COMMENTS ON THE UTILIZATION OF NOISE MEASUREMENTS FOR THE CHARACTERIZATION OF ELECTROMIGRATION IN METAL LINES

Authors
CIOFI C DATTILO V NERI B
Citation
C. Ciofi et al., COMMENTS ON THE UTILIZATION OF NOISE MEASUREMENTS FOR THE CHARACTERIZATION OF ELECTROMIGRATION IN METAL LINES, Microelectronics and reliability, 37(10-11), 1997, pp. 1607-1610
Citations number
8
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Microelectronics and reliability → ACNP
ISSN journal
00262714
Volume
37
Issue
10-11
Year of publication
1997
Pages
1607 - 1610
Database
ISI
SICI code
0026-2714(1997)37:10-11<1607:COTUON>2.0.ZU;2-#
Abstract
Some of the problems connected with the characterization of electromig ration by means of noise measurements are discussed in this paper. Som e specific criticisms moved in the past toward the interpretation of t he experimental data are also addressed. In particular, the question o f the interpretation of the 1/f(2) noise component is discussed. Final ly, a set of rules are given which should be followed, both in the cho ice of the instrumentation and in performing the measurements, in orde r to obtain meaningful and reliable results. (C) 1997 Elsevier Science Ltd.