DEVELOPMENT OF KINK IN THE OUTPUT I-V CHARACTERISTICS OF PSEUDOMORPHIC HEMTS AFTER HOT-ELECTRON ACCELERATED TESTING

Large decreases in the drain current in the linear and low V-ds region followed by a ''kink'' in the output I-d-V-ds characteristics have be en found after hot electron stress test in AlGaAs/InGaAs/GaAs power ps eudomorphic HEMT's. Decrease in the transconductance measured in linea r region, increase in the drain parasitic resistance and trasconductan ce frequency dispersion have also been observed and attributed to the generation of electron traps in the gate-to-drain access region. (C) 1 997 Elsevier Science Ltd.