AN AUTOMATIC ADAPTATION METHOD FOR HETEROJUNCTION BIPOLAR-TRANSISTOR DYNAMIC TEST

Authors
GAUFFRE S DUCHAMP G CASADEBAIG L PISTRE J CAZARRE A
Citation
S. Gauffre et al., AN AUTOMATIC ADAPTATION METHOD FOR HETEROJUNCTION BIPOLAR-TRANSISTOR DYNAMIC TEST, Microelectronics and reliability, 37(10-11), 1997, pp. 1695-1698
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Microelectronics and reliability → ACNP
ISSN journal
00262714
Volume
37
Issue
10-11
Year of publication
1997
Pages
1695 - 1698
Database
ISI
SICI code
0026-2714(1997)37:10-11<1695:AAAMFH>2.0.ZU;2-E
Abstract
The dynamic, especially RF, test of microwave components poses the pro blem of their adaptation. When these components are not line products, sorted by lots, their characteristics are often scattered and a custo mised adaptation becomes necessary. To overcome this problem we propos e a method which allows to automatically adapt the DUT, using a RF cir cuit designed to be computer controlled. The results are given, both f rom simulation and from experiments. (C) 1997 Elsevier Science Ltd.