THERMAL SIMULATION OF THE CZOCHRALSKI SILICON GROWTH-PROCESS BY 3 DIFFERENT MODELS AND COMPARISON WITH EXPERIMENTAL RESULTS

Citation
E. Dornberger et al., THERMAL SIMULATION OF THE CZOCHRALSKI SILICON GROWTH-PROCESS BY 3 DIFFERENT MODELS AND COMPARISON WITH EXPERIMENTAL RESULTS, Journal of crystal growth, 180(3-4), 1997, pp. 461-467
Citations number
16
Categorie Soggetti
Crystallography
Journal title
ISSN journal
00220248
Volume
180
Issue
3-4
Year of publication
1997
Pages
461 - 467
Database
ISI
SICI code
0022-0248(1997)180:3-4<461:TSOTCS>2.0.ZU;2-E
Abstract
Temperatures were measured within an industrial Czochralski silicon pu ller and compared with simulation results. The temperatures were measu red by thermocouples in the crystal along the axis as well as inside t he lateral and bottom insulations. The temperature distribution of the furnace was computed using three different software codes. It could b e demonstrated that today's simulation methods are capable of handling such a complex heat transfer simulation task as that encountered in t he case of Czochralski silicon growth furnaces, with the exception of the melt convection problem, which has not yet been satisfactorily sol ved.