Dc. Reynolds et al., HIGH-QUALITY INTERFACES IN GAAS-ALAS QUANTUM-WELLS DETERMINED FROM HIGH-RESOLUTION PHOTOLUMINESCENCE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(5), 1997, pp. 1703-1706
High resolution photoluminescence (PL) measurements performed on sever
al GaAs-AlAs quantum well structures revealed sharp excitonic transiti
ons separated in energies corresponding to roughly half-monolayer fluc
tuations in well size. The narrow linewidths correlate with interface
island structure whose lateral extent is either much larger or much sm
aller than the exciton diameter. The half-monolayer separation results
from a sharply peaked PL intensity response occurring around those ar
eas of the laterally nonuniform interface which have roughly 50% islan
d coverage, with the average island size much smaller than the exciton
diameter, about 225 Angstrom. (C) 1997 American Vacuum Society. [S073
4-211X(97)04505-8].