DOES ELECTRON HOLOGRAPHY ENERGY-FILTER

Authors
Citation
Jch. Spence et Jm. Zuo, DOES ELECTRON HOLOGRAPHY ENERGY-FILTER, Ultramicroscopy, 69(3), 1997, pp. 185-190
Citations number
14
Categorie Soggetti
Microscopy
Journal title
ISSN journal
03043991
Volume
69
Issue
3
Year of publication
1997
Pages
185 - 190
Database
ISI
SICI code
0304-3991(1997)69:3<185:DEHE>2.0.ZU;2-P
Abstract
The contribution of inelastic scattering to off-axis electron hologram s is considered. For a sample which introduces a single sharp energy l oss delta E, we find that this loss contributes time-independent inter ference fringes to the hologram provided delta E < Delta E, where Delt a E is the electron source energy spread. The relevance of this to two -beam lattice imaging at the Bragg condition is outlined, and the rela tionship between the uncertainty principle, the Van Cittert-Zernike th eorem and the phase-space interpretation of coherence and Brightness r eviewed.