Sy. Cha et al., IRIDIUM THIN-FILM AS A BOTTOM ELECTRODE FOR HIGH DIELECTRIC (BA,SR)TIO3 CAPACITORS, Integrated ferroelectrics, 17(1-4), 1997, pp. 187-195
We propose Ir thin films as new electrode materials for high dielectri
c BST capacitors. Ir was found to be superior to Pt in a number of asp
ects such as resistivity, adhesion and surface roughness. The Pt/BST/I
r/SiO2/Si capacitors showed leakage currents as low as Pt/PST/Pt/SiO2/
Si ones, but higher capacitance resulted. For endurance properties wit
h +5V unipolar pulse trains, the dielectric constant of BST films on I
r decreased by only 10% below its initial value after switching of 10(
9) cycles while that on Pt degraded by 30% after 10(8) cycles. Ir bott
om electrode effects on BST film properties were well explained by the
formation of IrO2 phases on the surface of Ir electrodes.