IRIDIUM THIN-FILM AS A BOTTOM ELECTRODE FOR HIGH DIELECTRIC (BA,SR)TIO3 CAPACITORS

Citation
Sy. Cha et al., IRIDIUM THIN-FILM AS A BOTTOM ELECTRODE FOR HIGH DIELECTRIC (BA,SR)TIO3 CAPACITORS, Integrated ferroelectrics, 17(1-4), 1997, pp. 187-195
Citations number
6
Categorie Soggetti
Physics, Condensed Matter","Engineering, Eletrical & Electronic","Physics, Applied
Journal title
ISSN journal
10584587
Volume
17
Issue
1-4
Year of publication
1997
Pages
187 - 195
Database
ISI
SICI code
1058-4587(1997)17:1-4<187:ITAABE>2.0.ZU;2-K
Abstract
We propose Ir thin films as new electrode materials for high dielectri c BST capacitors. Ir was found to be superior to Pt in a number of asp ects such as resistivity, adhesion and surface roughness. The Pt/BST/I r/SiO2/Si capacitors showed leakage currents as low as Pt/PST/Pt/SiO2/ Si ones, but higher capacitance resulted. For endurance properties wit h +5V unipolar pulse trains, the dielectric constant of BST films on I r decreased by only 10% below its initial value after switching of 10( 9) cycles while that on Pt degraded by 30% after 10(8) cycles. Ir bott om electrode effects on BST film properties were well explained by the formation of IrO2 phases on the surface of Ir electrodes.