EFFECT OF MEASUREMENT TEMPERATURE ON THE DIELECTRIC AND FERROELECTRICPROPERTIES OF VARIOUS SOL-GEL DERIVED PLZT THIN-FILMS

Authors
MCCARTHY F MCCARTHY K TEOWEE G BUKOWSKI T ALEXANDER T UHLMANN DR
Citation
F. Mccarthy et al., EFFECT OF MEASUREMENT TEMPERATURE ON THE DIELECTRIC AND FERROELECTRICPROPERTIES OF VARIOUS SOL-GEL DERIVED PLZT THIN-FILMS, Integrated ferroelectrics, 17(1-4), 1997, pp. 213-220
Citations number
14
Categorie Soggetti
Physics, Condensed Matter","Engineering, Eletrical & Electronic","Physics, Applied
Journal title
Integrated ferroelectrics → ACNP
ISSN journal
10584587
Volume
17
Issue
1-4
Year of publication
1997
Pages
213 - 220
Database
ISI
SICI code
1058-4587(1997)17:1-4<213:EOMTOT>2.0.ZU;2-A
Abstract
Sol-gel derived PLZT, including PbTiO3, PbLaTiO3 28, PLZT 9/65/35 and PZT 53/47 films were prepared on platinized substrates. The dielectric and ferroelectric properties of the films were measured at 260K - 580 K. The values of polarization, coercive field, dielectric constant and dissipation factor in these films typically increased with increasing temperature. The changes in dielectric properties of the films with t emperature were not sharp unlike the transitions in single crystals or bulk ceramics. The pyroelectric coefficients, on the other hand, decr eased monotonically with increasing temperature in all these films.