G. Schindler et al., INFLUENCE OF TI-CONTENT IN THE BOTTOM ELECTRODES ON THE FERROELECTRICPROPERTIES OF SRBI2TA2O9 (SBT), Integrated ferroelectrics, 17(1-4), 1997, pp. 421-432
Stress behavior, results of AES analysis and electrical properties of
SBT in dependence of electrode structure and annealing conditions are
discussed. Evidence for degradation of the electrical properties of SB
T due to diffusion of Ti is presented.