Jh. Tsai et al., HETEROSTRUCTURE-EMITTER AND PSEUDOMORPHIC BASE TRANSISTOR (HEPBT) WITH A GRADED ALXGA1-XAS CONFINEMENT LAYER, Materials chemistry and physics, 51(2), 1997, pp. 114-116
In this paper, we will demonstrate a new heterostructure-emitter and p
seudomorphic base transistor (HEPBT) with a graded AlxGa1-xAs confinem
ent layer. The device studied takes the advantages of the heterostruct
ure-emitter bipolar transistor, the graded heterojunction bipolar tran
sistor (HBT), and an AlGaAs/GaAs HBT with an InGaAs base layer simulta
neously. Owing to the presence of the GaAs emitter and graded AlxGa1-x
As confinement layer, a low offset voltage of 100 mV is obtained. Also
, attributed tu the insertion of a InGaAs quantum well, a high emitter
efficiency yielding the high common-emitter current gain of 120 is ac
hieved. Consequently, the HEPBT studied shows a promise for circuit ap
plications. (C) 1997 Elsevier Science S.A.