HETEROSTRUCTURE-EMITTER AND PSEUDOMORPHIC BASE TRANSISTOR (HEPBT) WITH A GRADED ALXGA1-XAS CONFINEMENT LAYER

Citation
Jh. Tsai et al., HETEROSTRUCTURE-EMITTER AND PSEUDOMORPHIC BASE TRANSISTOR (HEPBT) WITH A GRADED ALXGA1-XAS CONFINEMENT LAYER, Materials chemistry and physics, 51(2), 1997, pp. 114-116
Citations number
8
Categorie Soggetti
Material Science
ISSN journal
02540584
Volume
51
Issue
2
Year of publication
1997
Pages
114 - 116
Database
ISI
SICI code
0254-0584(1997)51:2<114:HAPBT(>2.0.ZU;2-G
Abstract
In this paper, we will demonstrate a new heterostructure-emitter and p seudomorphic base transistor (HEPBT) with a graded AlxGa1-xAs confinem ent layer. The device studied takes the advantages of the heterostruct ure-emitter bipolar transistor, the graded heterojunction bipolar tran sistor (HBT), and an AlGaAs/GaAs HBT with an InGaAs base layer simulta neously. Owing to the presence of the GaAs emitter and graded AlxGa1-x As confinement layer, a low offset voltage of 100 mV is obtained. Also , attributed tu the insertion of a InGaAs quantum well, a high emitter efficiency yielding the high common-emitter current gain of 120 is ac hieved. Consequently, the HEPBT studied shows a promise for circuit ap plications. (C) 1997 Elsevier Science S.A.