MULTIWAFER MOCVD SYSTEMS FOR FERROELECTRICS

Citation
M. Deschler et al., MULTIWAFER MOCVD SYSTEMS FOR FERROELECTRICS, Integrated ferroelectrics, 18(1-4), 1997, pp. 119-125
Citations number
9
Categorie Soggetti
Physics, Condensed Matter","Engineering, Eletrical & Electronic","Physics, Applied
Journal title
ISSN journal
10584587
Volume
18
Issue
1-4
Year of publication
1997
Pages
119 - 125
Database
ISI
SICI code
1058-4587(1997)18:1-4<119:MMSFF>2.0.ZU;2-9
Abstract
The need for ferroelectric capacitors and FRAMs is rapidly increasing as world wide communication networks are being erected and a higher in tegration of memory chips will be introduced in the next few years. To meet the demand for economical production of the raw material - thin film structures of ferroelectrics - we developed a metalorganic vapor phase epitaxy (MOVPE) reactor for the deposition of the material films on a large substrate area. We expanded the existing Planetary Reactor (R) to be able to take charges of nine six inch wafers or the equivale nt (total substrate area of 0.25 square meters). The growth process ca n be predicted by numerical simulations rather than by growth runs in the real reactor. The reactor is proven in mass production environment s for the growth of multicompound semiconductors. A major achievement is the compensation of the depletion of the gas phase which can result in poor uniformity of the films. By rotating the wafers, the growth r ate along the direction of flow is averaged to produce uniform films w ith an expected variation of less than +/-1.5% in composition and +/-2 % in thickness across an area with a diameter of 10 inches.