REASSESSMENT OF THE PIEZOELECTRIC CONSTANT IN GAAS BY STUDYING THE ELECTRON-TRANSPORT OF HIGH-PURITY MBE-GROWN GAAS

Authors
Citation
Vwl. Chin, REASSESSMENT OF THE PIEZOELECTRIC CONSTANT IN GAAS BY STUDYING THE ELECTRON-TRANSPORT OF HIGH-PURITY MBE-GROWN GAAS, Solid-state electronics, 37(7), 1994, pp. 1345-1347
Citations number
9
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
00381101
Volume
37
Issue
7
Year of publication
1994
Pages
1345 - 1347
Database
ISI
SICI code
0038-1101(1994)37:7<1345:ROTPCI>2.0.ZU;2-T
Abstract
Acoustic phonon piezoelectric scattering is the most important scatter ing process in high purity (n congruent-to 10(13)) GaAs at low tempera tures. In this work, we have reassessed the value of the piezoelectric constant by fitting the calculated Hall mobility to the highest purit y MBE grown GaAs Hall mobility in the temperature range where this sca ttering is most important. Since all other variables are known, leavin g the piezoelectric constant as the only unknown parameter, we determi ned a value of about 1.77 x 10(7) V-cm-1 which is approximately 20% hi gher than the value usually found in the literature.