STUDIES ON TEMPERATURE AND CONCENTRATION-DEPENDENT MINORITY-CARRIER LIFETIME IN HEAVILY-DOPED INGAASP

Authors
DE SS GHOSH AK HAJRA AK HALDER JC BERA M
Citation
Ss. De et al., STUDIES ON TEMPERATURE AND CONCENTRATION-DEPENDENT MINORITY-CARRIER LIFETIME IN HEAVILY-DOPED INGAASP, Solid-state electronics, 37(7), 1994, pp. 1455-1457
Citations number
16
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
Solid-state electronics → ACNP
ISSN journal
00381101
Volume
37
Issue
7
Year of publication
1994
Pages
1455 - 1457
Database
ISI
SICI code
0038-1101(1994)37:7<1455:SOTACM>2.0.ZU;2-K