Jp. Blanchard, TARGET TEMPERATURE PREDICTION FOR PLASMA SOURCE ION-IMPLANTATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(2), 1994, pp. 910-917
Plasma source ion implantation (PSII) is a plasma-based ion implantati
on technique which requires pulsed operation. Because the power incide
nt on the implanted objects (targets) can be large, target temperature
s can be quite high. Therefore, target temperature prediction can be q
uite useful, both in reaching high temperatures when they are desirabl
e, and in avoiding high temperatures when they are undesirable. In thi
s paper, a simple, time-dependent, lumped-capacity thermal model is de
veloped for predicting temperatures in PSII targets. Two simple analyt
ical models are used to justify the assumptions used in developing the
lumped model. Comparison of the model with measured target temperatur
es is used to validate the assumptions of the model. The comparison is
favorable.