Wy. Choi et Cg. Fonstad, GROWTH OPTIMIZATION OF MOLECULAR-BEAM EPITAXY-GROWN INALAS ON INP, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(2), 1994, pp. 1013-1015
The effects of different molecular beam epitaxy (MBE) growth condition
s on material qualities of In0.52Al0.48As on InP were investigated. In
vestigated parameters were growth temperature and As overpressure. A r
ange of these two parameters within which InAlAs grows under the As-ri
ch condition was first determined by reflection high-energy electron d
iffraction. Five different InAlAs samples were grown within this range
and characterized by double crystal x-rav diffraction, Hall measureme
nt, and photoluminescence. Based on the results of these characterizat
ions, the optimal MBE growth condition for InAlAs was determined.