Sr. Johnson et al., FACTORS AFFECTING THE TEMPERATURE UNIFORMITY OF SEMICONDUCTOR SUBSTRATES IN MOLECULAR-BEAM EPITAXY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(2), 1994, pp. 1225-1228
The temperature of GaAs substrates is profiled in a molecular-beam epi
taxy system with a spatial resolution of 3 mm and a thermal resolution
of 0.4-degrees-C, respectively. The effects of substrate doping, back
surface textures, thermal contact to the holder, and a pyrolytic boro
n nitride diffuser plate, on the temperature uniformity, are explored
for indium-free mounted substrates. Both positive and negative curvatu
re temperature profiles are observed.